Dear Jakob,
Although not exactly equivalent to the letter with the situation you describe, it is quite common in CryoEM to screen micrographs based on both visual appearance or power spectra, using only the particularly "shiny" mics.
This is particularly important when shooting for very high resolution. E.g. in this recent paper (http://www.sciencemag.org/content/348/6239/1147.full) the authors selected stacks with visible Thon rings in the power spectra beyond 3 Å (these micrographs represent a small fraction of the total).
The better micrographs have less beam induced movement and/or lower background (thinner ice) - I believe this is roughly analogous to the situation you are referring to in astronomy.
Cheers,
Oliver.
On Mon, 17 Aug 2015 21:32:42 +0000, Keller, Jacob <[log in to unmask]> wrote:
>Hi All,
>
>Has anyone ever tried so-called "lucky imaging" for XRD or perhaps EM/single-particle? Seems like it might be applicable, and it's a clever and simple technique, although I guess photons/electron counts always seem to be at a premium.
>
>https://en.wikipedia.org/wiki/Lucky_imaging
>
>Jacob Keller
>
>*******************************************
>Jacob Pearson Keller, PhD
>Looger Lab/HHMI Janelia Research Campus
>19700 Helix Dr, Ashburn, VA 20147
>email:�[log in to unmask]
>*******************************************
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