Dear Christopher,
you said each wedge is about 2-3 degrees. Are you confident the high
I/sigI is meaningful and not a result of very little data?
Just an idea.
Regards,
Tim
On 07/18/2015 10:34 AM, Christopher wrote:
> Hi Community,
>
> I was hoping to get some advice on a problem I am running into. I have very nice crystals that consistently index well and diffract to about 3.4 Angstrom. Unfortunately, they are very radiation sensitive, thus requiring translation during data collection after acquiring ~2-3 degrees of data. Using either XDS or imosflm, integration and scaling of one "wedge" of data (before translating) results in very nice I/sig values for both the low and high resolution data (+20 and 2 respectively). However, whenever I try to integrate and scale across the entire data range for the crystal, these values drop significantly (ie. 3 and 0.45), eventhough the images being used for integration all have similar intensities and background counts across each resolution shell.
>
> Does anyone have any tips on how I can process data like this or which parameters I could change that may increase my I/sigI values when integrating the entire data range?
>
> Thanks so much,
> Christopher
>
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Dr Tim Gruene
Institut fuer anorganische Chemie
Tammannstr. 4
D-37077 Goettingen
phone: +49 (0)551 39 22149
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