Hi Community,
I was hoping to get some advice on a problem I am running into. I have very nice crystals that consistently index well and diffract to about 3.4 Angstrom. Unfortunately, they are very radiation sensitive, thus requiring translation during data collection after acquiring ~2-3 degrees of data. Using either XDS or imosflm, integration and scaling of one "wedge" of data (before translating) results in very nice I/sig values for both the low and high resolution data (+20 and 2 respectively). However, whenever I try to integrate and scale across the entire data range for the crystal, these values drop significantly (ie. 3 and 0.45), eventhough the images being used for integration all have similar intensities and background counts across each resolution shell.
Does anyone have any tips on how I can process data like this or which parameters I could change that may increase my I/sigI values when integrating the entire data range?
Thanks so much,
Christopher
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