SYSTEM AND BAYESIAN RELIABILITY
Essays in Honor of Professor Richard E Barlow on His 70th Birthday

edited by Yu Hayakawa (Victoria University of Wellington, New Zealand),
Telba Irony (Food and Drug Administration, USA) & Min Xie (National
University of Singapore, Singapore)
With foreword by Professor D V Lindley & Professor A P Basu

This volume is a collection of articles on reliability systems and Bayesian
reliability analysis. Written by reputable researchers worldwide, the
articles are self-contained and are linked with literature reviews and new
research ideas. The book is dedicated to Emeritus Professor Richard E
Barlow, who is well known for his pioneering research on reliability theory
and Bayesian reliability analysis.

Contents: System Reliability Analysis; Ageing Properties; Bayesian Analysis.

Readership: Students, academics, researchers and professionals in
industrial/system/computer engineering, probability and statistics, and
applied mathematics.

420pp (approx.)  Pub. date: Scheduled Winter 2001
ISBN 981-02-4865-2 US$62/£42

Announcement and order form:
http://www.ise.nus.edu.sg/staff/xiemin/book/Announce-Barlow.pdf

Book Cover:
http://www.ise.nus.edu.sg/staff/xiemin/book/Book-Barlow-cover.jpg

Content pages:
http://www.ise.nus.edu.sg/staff/xiemin/book/Book-Barlow-contents.pdf

SYSTEM AND BAYESIAN RELIABILITY
Volume 5 - Series on Quality, Reliability and Engineering Statistics

Other volumes in the book series:
Recent Advances in Reliability and Quality Engineering
by H Pham (Rutgers University, USA)
ISBN 981-02-4221-2

Contributions to Hardware and Software Reliability
by P K Kapur, R B Garg (University of Delhi, India) & S Kumar (Victoria
University Melbourne, Australia)
ISBN 981-02-3751-0

Frontiers in Reliability
edited by A P Basu (University of Missouri-Columbia, USA), S K Basu (Indian
Institute of Management, India) & S Mukhopadhyay (Calcutta University,
India)
ISBN 981-02-3360-4


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SYSTEM AND BAYESIAN RELIABILITY
Essays in Honor of Professor Richard E Barlow on His 70th Birthday
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