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LIB-RFID-UK Archives


April 2011


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Table of Contents:

Bibliotheca and ITG merge (1 message)
Book Sorter Tender (1 message)
Chip & PIN - usage and minimum levels (1 message)
D Tech: an apology (1 message)
FW: 3M News Release (1 message)
ISO 28560 published - but compliance testing may still be a problem (3 messages)
List etiquette (1 message)
RFID gates testing/reliability (12 messages)
RFID tender specification (1 message)
Tagging Mutlimedia (2 messages)
TC46/SC4/WG11 (2 messages)

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Subject Sorted by Subject, Chronologically

From

Date

Size

New Thread

Bibliotheca and ITG merge

Bibliotheca and ITG merge

Mick Fortune <[log in to unmask]>

Thu, 7 Apr 2011 07:44:43 +0100

174 lines

New Thread

Book Sorter Tender

Book Sorter Tender

Eleanor Clark-Webster <[log in to unmask]>

Wed, 27 Apr 2011 12:04:58 +0100

31 lines

New Thread

Chip & PIN - usage and minimum levels

Re: Chip & PIN - usage and minimum levels

Jamie O Neill <[log in to unmask]>

Fri, 1 Apr 2011 11:25:17 +0100

75 lines

New Thread

D Tech: an apology

D Tech: an apology

Mick Fortune <[log in to unmask]>

Tue, 5 Apr 2011 13:31:37 +0100

387 lines

New Thread

FW: 3M News Release

FW: 3M News Release

Mick Fortune <[log in to unmask]>

Tue, 5 Apr 2011 08:28:58 +0100

959 lines

New Thread

ISO 28560 published - but compliance testing may still be a problem

ISO 28560 published - but compliance testing may still be a problem

Mick Fortune <[log in to unmask]>

Mon, 4 Apr 2011 08:04:29 +0100

307 lines

Re: ISO 28560 published - but compliance testing may still be a problem

Andy Fish <[log in to unmask]>

Mon, 4 Apr 2011 10:55:45 +0100

361 lines

Re: ISO 28560 published - but compliance testing may still be a problem

Mick Fortune <[log in to unmask]>

Tue, 5 Apr 2011 09:27:05 +0100

789 lines

New Thread

List etiquette

List etiquette

Lewis Nicholas Mr (LIB) <[log in to unmask]>

Sat, 9 Apr 2011 07:54:57 +0100

37 lines

New Thread

RFID gates testing/reliability

RFID gates testing/reliability

Terri McCargar <[log in to unmask]>

Thu, 7 Apr 2011 14:37:15 +0100

43 lines

Re: RFID gates testing/reliability

Vincent Matthews <[log in to unmask]>

Thu, 7 Apr 2011 14:59:32 +0100

71 lines

Re: RFID gates testing/reliability

Walsh Ben <[log in to unmask]>

Thu, 7 Apr 2011 14:59:27 +0100

96 lines

Re: RFID gates testing/reliability

Curwen Thomas <[log in to unmask]>

Thu, 7 Apr 2011 14:28:05 +0000

74 lines

Re: RFID gates testing/reliability

Nicky Berry <[log in to unmask]>

Thu, 7 Apr 2011 15:55:59 +0100

137 lines

Re: RFID gates testing/reliability

Vincent Matthews <[log in to unmask]>

Thu, 7 Apr 2011 16:03:25 +0100

105 lines

Re: RFID gates testing/reliability

Stock, Charlotte (LRC) <[log in to unmask]>

Thu, 7 Apr 2011 16:06:43 +0100

214 lines

Re: RFID gates testing/reliability

Usher, John <[log in to unmask]>

Thu, 7 Apr 2011 16:08:35 +0100

229 lines

Re: RFID gates testing/reliability

Mick Fortune <[log in to unmask]>

Thu, 7 Apr 2011 17:49:00 +0100

296 lines

Re: RFID gates testing/reliability

Mike Chambers <[log in to unmask]>

Thu, 7 Apr 2011 19:46:20 +0000

183 lines

Re: RFID gates testing/reliability

Usher, John <[log in to unmask]>

Fri, 8 Apr 2011 09:40:43 +0100

321 lines

Re: RFID gates testing/reliability

Ivar Thyssen <[log in to unmask]>

Fri, 8 Apr 2011 20:01:26 +0200

234 lines

New Thread

RFID tender specification

RFID tender specification

Anna O'Neill <[log in to unmask]>

Fri, 8 Apr 2011 12:11:24 +0100

20 lines

New Thread

Tagging Mutlimedia

Re: Tagging Mutlimedia

Jamie O Neill <[log in to unmask]>

Fri, 1 Apr 2011 11:51:54 +0100

349 lines

Re: Tagging Mutlimedia

Paul Chartier <[log in to unmask]>

Mon, 4 Apr 2011 13:16:41 +0100

211 lines

New Thread

TC46/SC4/WG11

TC46/SC4/WG11

Mick Fortune <[log in to unmask]>

Tue, 5 Apr 2011 16:48:57 +0100

169 lines

Re: TC46/SC4/WG11

Paul Chartier <[log in to unmask]>

Tue, 5 Apr 2011 19:30:36 +0100

183 lines

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