Oh, I thought the sigmas were derived from the differences in intensities of the multiple measurements of a given reflection--I guess both the individual-measurement counting stats and differences in measurements must be combined in the end. But, what does the software do if somehow a sigma=0 creeps in, or more generally, what is the best statistical approach for this?
Singly-measured reflections should have a sigma from Poisson counting statistics, so that should not be a problem. A problem might occur if the X-ray background is exactly zero and the observed (sic) intensity is exactly zero.
From: CCP4 bulletin board [[log in to unmask]] on behalf of Jacob Keller [[log in to unmask]]
Sent: Thursday, August 23, 2012 12:36 PM
To: [log in to unmask]
Subject: [ccp4bb] Calculating I/sig when sig = 0
Dear Crystallographers,
what approach is taken to calculate I/sig when sig = 0? (This could happen for singly-measured reflections or perhaps some other scenario, such as rejection of other measurements leaving only one measurement.) I could imagine alternatives, but what is actually done?
JPK
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Jacob Pearson Keller
Northwestern University
Medical Scientist Training Program
email: [log in to unmask]
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