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*** Sorry for cross-posting *** Dear All, a one-day workshop on Statistical Methods Applied to Microelectronics, will be held on June 13th, 2011 at the Catholic University of Milan. The workshop aims at sharing both methodological and practical issues about the use of statistics in microelectronics manufacturing giving an opportunity for statisticians and users from industry and research labs to meet and share their experiences and the state of the art of statistical methodologies applied in the semiconductor industry (process control, defectivity analyses, sampling reduction...). This event is an initiative of a team of academic and not academic statisticians that actively collaborate with microelectronics companies located in the area of Milan. It is organized under the patronage of ISBIS (the International Society for Business and Industrial Statistics), ENBIS (the European Network of Business and Industrial Statistics) and SIS (the Italian Statistical Society). The programme of the workshop includes talks by: Fabrizio Ruggeri, Geoff Vining, Ron Kenett and other speakers from universities, industries and software houses. A poster session will be organized. For more details, please visit the workshop website: http://convegni.unicatt.it/statistics_in_microelectronics . We look forward to meeting you Kind Regards, On behalf of the Organizing Committee ************************************************** Prof. Diego Zappa Department of Statistical Sciences Catholic University - Milan (Italy) Tel. +39 0272343664 e-mail: [log in to unmask]<mailto:[log in to unmask]> ************************************************** You may leave the list at any time by sending the command SIGNOFF allstat to [log in to unmask], leaving the subject line blank.