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*Submission Deadline Extended to September 30th*
10th IEEE International Conference on Software Testing,
Verification and Validation (ICST 2017)
13-18 March 2017, Tokyo, Japan
http://aster.or.jp/conference/icst2017/calls/calls.html
*Call For Research Track Papers*
ICST is 10 years old! Come join us to celebrate this important
milestone for the most prestigious event in our field of Software
Testing, Verification and Validation. ICST 2017 is intended to
provide a common forum for researchers, scientists, engineers and
practitioners throughout the world to present their latest research
findings, ideas, developments and applications in the area of Software
Testing, Verification and Validation.
Technical Program Committee Chairs, Ina Schieferdecker of Fraunhofer
FOKUS/TU Berlin, Germany, and Hironori Washizaki of Waseda University,
Japan, invite the submission of high-quality research track papers
in all areas of software testing, verification, and validation.
Research track papers should present original and significant work that
advances the state of the art. Topics of interest include, but are not
limited to:
- Testing theory and practice
- Design for testability
- Model-based testing
- Model-driven engineering and testing
- Formal verification and testing, such as model checking
- Software reliability, security, safety, and trustworthiness
- Domain specific testing, such as:
- Mobile app testing
- Web-service testing
- Database testing
- Embedded software testing
- Testing concurrent software
- Testing large-scale distributed systems
- Testing cloud systems
- Testing real-time systems
- Testing data-intensive systems
- Testing in multi-core environments
- Types of testing, such as:
- Performance and QoS testing
- Security testing including fuzzing
- Conformance and interoperability testing
- Static analysis, code reviews and inspections
- Testing of open source and third-party software
- Testing and analysis tools
- Technology transfer in testing
- Testing education
- Testing in globally-distributed organizations
- Agile/iterative/incremental testing processes
- Testing standards and technologies
- Testing and verification metrics
- Quality assurance
- Empirical studies
- Experience reports
*Important Dates*
- Submission of full papers: September 30th, 2016 (extended)
- Notification of acceptance: November 26th, 2016 (extended)
Each submission will be reviewed by at least three members of the ICST
Program Committee. Authors of the best papers presented at ICST 2017
will be invited to extend their work for possible inclusion in a
special issue of Journal of Software Testing, Verification and
Reliability (STVR) (TBD).
Format Research papers must conform to the two-column IEEE conference
publication format. Templates for Latex and Word are available at
http://www.ieee.org/conferences_events/conferences/publishing/templates.html
; use the letter format templates and the "conference" option (i.e.,
not the Computer Society format).
Papers must be submitted in PDF format and must not exceed 10 pages
(+2 pages for references). ICST uses single-blind reviewing, so please
include all author names and affiliations.
We invite submission of research and technical papers that describe
original and significant work in the research and practice of software
testing, verification and validation. Case studies and empirical
research papers are also welcome.
Papers must neither have been previously accepted for publication nor
be under submission in another conference or journal. The ICST 2017
research track accepts only full research papers. Short papers are not
accepted to the research track.
How to submit? Submissions will be handled via EasyChair at
http://easychair.org/conferences/?conf=icst2017
More details at:
http://www.aster.or.jp/conference/icst2017/calls/calls.html
*Program Committee Chairs*
Ina Schieferdecker, Fraunhofer FOKUS/TU Berlin, Germany
Hironori Washizaki, Waseda University, Japan
*Program Committee*
Shaukat Ali, Simula Research Laboratory, Norway
Nadia Alshahwan, University College London, UK
Anneliese Andrews, University of Denver, USA
Paul Baker, Visa, UK
Fevzi Belli, University of Paderborn, Germany
Cristiano Bertolini, Universidade Federal de Santa Maria, Brazil
Bob Binder, Software Engineering Institute | Carnegie Mellon University, USA
Kirill Bogdanov, The University of Sheffield, UK
Ana Cavalli, Institut National des Telecommunications, France
Byoungju Choi, Ewha Womans University, Korea
Marcelo d'Amorim, Federal University of Pernambuco, Brazil
Juergen Dingel, Queen's University, Canada
Rachida Dssouli, Concordia University, Canada
Stephen Edwards, Virginia Tech, USA
Michael Felderer, University of Innsbruck, Austria
Robert Feldt, Blekinge Institute of Technology, Sweden
Franck Fleurey, SINTEF, Norway
Marcelo Frias, Universidad de Buenos Aires, Argentina
Sudipto Ghosh, Colorado State University, USA
Jens Grabowski, Gottingen University, Germany
Mark Harman, University College London, UK
Hadi Hemmati, University of Manitoba, Canada
Robert Hierons, Brunel University, UK
Muhammad Zohaib Iqbal, FAST-NUCE, Pakistan
Raghu Kacker, NIST, USA
Aditya Kanade, Indian Institute of Science, India
Sarfraz Khurshid, University of Texas at Austin, USA
Moonzoo Kim, KAIST, Korea
Yves Le Traon, University of Luxembourg, Luxembourg
Bruno Legeard, Smartesting, France
Nan Li, Medidata Solutions, USA
Mika Mantyla, University of Oulu, Finland
Eda Marchetti, ISTI-CNR, Italy
Wes Masri, American University of Beirut, Lebanon
Phil McMinn, University of Sheffield, UK
Ali Mesbah, University of British Columbia, Canada
Jurgen Munch, University of Helsinki, Finland
Shiva Nejati, University of Luxembourg, Luxembourg
Marcel Oliveira, Universidade Federal do Rio Grande do Norte, Brazil
Manuel Oriol, ABB Corporate Research, Switzerland
Mike Papadakis, University of Luxembourg, Luxembourg
Corina Pasareanu, CMU/NASA Ames Research Center, USA
Paul Pettersson, Malardalen University, Sweden
Mauro Pezze, University of Lugano, Switzerland
Lori Pollock, University of Delaware, USA
Mukul Prasad, Fujitsu, USA
Alexander Pretschner, Technische Universitaet Muenchen, Germany
Brian Robinson, ABB Inc. - US Corporate Research, USA
Abhik Roychoudhury, National University of Singapore, Singapore
Per Runeson, Lund University, Sweden
Neha Rungta, NASA Ames Research Center, USA
Ina Schafer, University of Braunschweig, Germany
Itai Segall, Bell Labs, Nokia, Israel
Junaid Haroon Siddiqui, LUMS, Pakistan
Saurabh Sinha, IBM Research, India
Paul Strooper, The University of Queensland, Australia
Nikolai Tillmann, Microsoft Research, USA
Paolo Tonella, Fondazione Bruno Kessler - IRST, Italy
T.H. Tse, The University of Hong Kong, Hong Kong
Tadahiro Uehara, Fujitsu Laboratories, Japan
Mark Utting, University of Waikato, New Zealand
Guowei Yang, Texas State University, USA
Zijiang Yang, Western Michigan University, USA
Shin Yoo, KAIST, Korea
Fadi Zaraket, American University of Beirut, Lebanon
Lingming Zhang, University of Texas at Dallas, USA
Peter Zimmerer, Siemens AG, Germany
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