Dear Crystallographers,
it seems to me that for clearly identifying/characterising anomalous
scatterers for a solved structure, one could make a map using two
datasets: one at the f" peak, one low energy remote. One would then
use the signal both from the Bijvoet differences in the peak dataset
plus the differences between the peak and low-energy datasets, which I
think I have seen called "dispersive" differences. I guess this would
be like a MAD map, but using pre-existing model phases--is there such
an animal in the software, or would it even be helpful?
Jacob Keller
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Jacob Pearson Keller
Northwestern University
Medical Scientist Training Program
cel: 773.608.9185
email: [log in to unmask]
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