I have a few years ago been involved in a patent dispute over the question of crystallinity. Many people think that you just measure the background and find the ratio in some way to the Bragg peaks as a measure of crystallinity. However this ignores the many different origins of the background ranging from diffractometer faults, air scattering, Compton scattering, fluorescence, short-range order diffuse scattering and so on and so on. Despite what many people think therefore, the whole concept of crystallinity is debatable. 

Then even if you know that the background is entirely due to amorphous material, there are the experimental difficulties in extracting the background to any sort of precision. The usual way is to some sort of whole pattern refinement, but this can be problematic when you have severe overlap of Bragg peaks especially at high angle where the diffraction pattern stops. 

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